Phase Transition of Single-Crystal C60 Films on GaAs(111) Substrates
1994 年 63 巻 12 号 p. 4290-4293
詳細
1994 年 63 巻 12 号 p. 4290-4293
X-ray diffraction measurements of single-crystal C60 film with the thickness of 800, Å (about 60, ML) were carried out at temperatures from 300, K to 20, K. An anomaly of the lattice parameter was observed at the transition temperature TC=240, K. The transition temperature of C60 film is 20, K lower than that of bulk crystal. The phase transition of C60 film was somewhat different from that in the bulk state.
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