Valence Band Density of States of the Manganese Silicides Studied by Soft X-Ray Emission Spectroscopy

抄録

Electronic states of manganese silicides with the composition of MnSi or MnSi_1.7 were investigated by soft X-ray emission spectroscopy. The formation of MnSi and MnSi_1.7 with single phase was identified by X-ray diffraction. Si-K_β and Si-L_{2, 3} emission-band spectra were measured, where the Si-K_β reflects the valence-band density of states with p-symmetry and the latter reflects the one with s- and/or d-symmetry. The spectrum of Si-L_{2, 3} for MnSi_1.7 was different from that of MnSi. The origin of this difference is discussed in comparison with those of other silicides.