Journal of the Physical Society of Japan
Online ISSN : 1347-4073
Print ISSN : 0031-9015
ISSN-L : 0031-9015
Conductance between Two Scanning-Tunneling-Microscopy Probes in Carbon Nanotubes
Takeshi Nakanishi, Tsuneya Ando
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2008 年 77 巻 2 号 p. 024703

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The conductance image between two probes of scanning tunneling microscopy (STM) is calculated in an armchair carbon nanotube within a tight-binding model and a realistic model for STM probes. A Kekulé-type pattern usually appears due to interference of states at K and K′ points except in special cases.
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© The Physical Society of Japan 2008
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