Crystal Texture of LiF Single Crystals by X-Ray Technique

Abstract

By the convergent X-ray beam method with transmission type monochromator by Kato (Acta Met. 5 (1957) 237), crystal texture of as-grown LiF single crystals is studied for thick as well as thin specimens. It is found that the topographic as well as the goniometric information is obtainable on a diffraction photograph by the profitable use of the convergent incident beam.
Observation of surface texture is also carried out by etching method to interpret more thoroughly the fine structure of diffraction pattern.