Measurement of the Intensity in Electron Diffraction by a CdS Single Crystal

Abstract

A method of measuring the intensity of electron in electron diffraction patterns by the electron-bombardment-induced-current (EBIC) in a CdS single crystal is described. The CdS detector is moved in the diffraction camera by a screw which is driven by a synchronous motor. EBIC is measured directly by a automatic recording millivoltmeter. EBIC properties of good crystals selected from those prepared by Frerichs’ method are given. It is shown that the intensity can be measured within 2–3% error, if suitable precautions are made. An example of the measurement on TlCl is also given.