Resonant Scattering of Photons in Mg and Si

Abstract

An NaI(Tl) scintillation spectrometer was used to study the resonant scattering of photons generated by the bremsstrahlung x-rays. The resonant levels were found at 10.2 and 9.3 MeV in Mg and at 11.3 MeV in Si. Their level widths were obtained by the self absoption method. They are 3.8 eV and 0.9 eV in Mg, and 8.3 eV in Si, respectively. The spins and parities of these levels were assigned to be 1⁺ by considering the isotopic spin multiplets.