Direct Observation of Antiparallel 180° Domains in BaTiO₃ by X-Ray Anomalous Dispersion Method

抄録

Antiparallel domain configurations in c-plate crystal are observed in {003} x-ray reflection micrographs by the intensity contrast caused by anomalous scattering of the incident CrKα radiation by Ba and Ti atoms.
The micrographs are taken with the scanning method of Lang applied to the reflection case.
Measured ratio between |F(00\bar3)|² and |F(003)|² by a single-crystal-diffractometer amounts to 1.16. It is shown that with this reflection the antiparallel domains can be clearly discriminated in the x-ray reflection images with strong intensity contrast, and that the domain reversal process can be followed non-destructively.