抄録
The temperature dependence of the generalized scattering factor corrected for inelastic excitations in the crystal is studied theoretically for dynamical diffraction of X-rays and electrons. It is shown that the generalized scattering factors Φh=\varphih+Ch0 for X-ray diffraction and χh=Vh+Ch0(Y) for electron diffraction (Ch0 and Ch0(Y) are parts due to inelastic electronic excitations, respectively) are modified by the usual Debye-Waller factor, when the thermal motion is described with rigid-ion model and Einstein model.