1970 年 29 巻 6 号 p. 1494-1499
Electrical resistivity has been measured on pure aluminum quenched from high temperatures (500°C∼600°C) and aged at low temperatures (−30°C∼−90°C). The decay of the quenched-in resistivity is perfectly second order after an initial transient. The process is concluded, from a discussion related to the clustering process of vacancies, to be controlled by the collision between single vacancies. The migration energy of the single vacancy Em1 and the difference between the migration energy of the divacancy Em2 and the binding energy of a divacancy B2 arc determined to be Em1=0.64±0.02 eV and Em2−B2=0.39±0.02 eV, respectively. No long range interaction is found from the consideration of the coordination number of the collision between single vacancies.
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