Optical Absorption Spectra of Ar–Xe Solid Solutions: The Cluster Band Due to Xe Impurities

抄録

The optical absorption spectra of Ar this films containing Xe with less than 0.042 molar fraction are studied by using synchrotron orbital radiation from a 1.3 GeV electron synchrotron at INS-Tokyo as a light source. Measurements are made at 10 K in the energy range from 8.5 eV to 11.5 eV. The intensity variation of a band, which appears at about 9.03 eV in a sample containing 0.007 molar fraction of Xe, is investigated as the function of Xe concentration. The analysis reveals that the band is originated from the dimer of Xe atoms in solid Ar.