Journal of the Physical Society of Japan
Online ISSN : 1347-4073
Print ISSN : 0031-9015
ISSN-L : 0031-9015
A Two-Wavelength Interferometric Measurement of the Reflection Process in an Ionizing Shock Wave
Masahiko KawamuraHiromichi EzumiNoriaki Gohda
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1981 年 50 巻 5 号 p. 1419-1420

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Electron and atom number densities of partially ionized krypton behind the reflected shock waves were measured by using a two-wavelength Mach-Zehnder interferometer. Measurements were carried out for flows with an initial pressure p1=1.5 Torr and incident shock Mach numbers Ms∼12. Electron and atom number densities in equilibrium were measured to be (2.00±0.09)×1017 cm−3 and (9.5±0.7)×1017 cm−3 respectively. These values are in good agreement with those given by theory.

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