The K-Capture Probabilities to 400.56 and 279.48 keV Levels in the Decay of ⁷⁵Se

抄録

Precisely calibrated high resolution intrinsic semiconductor detector has been used to find K-capture probabilities to 400.56 and 279.48 keV levels in the decay of ⁷⁵Se. The measurement to 279.48 keV level is reported for the first time in literature.