Journal of the Physical Society of Japan
Online ISSN : 1347-4073
Print ISSN : 0031-9015
ISSN-L : 0031-9015
A Diffraction Study of SiO2 Glass—An Analysis of Neutron and X-Ray Data by a Liquid Model—
Yukio TanakaNorio OhtomoMeiseki Katayama
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1985 年 54 巻 3 号 p. 967-976

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The neutron structure factor for SiO2 glass at 22.0±0.5°C was determined in the range of Q, 1.0–25.5 Å−1, by means of the time-of-flight (TOF) neutron diffraction method using the electron linear accelerator (LINAC). An analysis of neutron and X-ray diffraction data was carried out by using a general procedure of analysis of structure factors based on a theoretical viewpoint of liquids. Excellent agreement between the calculated structure factor curves and the observed ones over the whole range of Q has ascertained that the structure of SiO2 glass can be explained as a liquid-like structure which is an aggregate of randomly packed clusters consisting of five SiO2 ‘molecules’. Within the cluster one central ‘molecule’ is tetrahedrally surrounded by four peripheral ‘molecules’ with a random orientation about the Si–O bond direction.
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