X-Ray Structure Investigation of Single Crystals of SnTe Doped with the Various 3d Transition Elements of Cr, Mn, Fe, Co and Ni
1988 年 57 巻 11 号 p. 3820-3823
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1988 年 57 巻 11 号 p. 3820-3823
X-ray diffraction data from as-grown and annealed single crystals of Sn1−x(Me)xTe (Me=Cr, Mn, Fe, Co and Ni; x ranges from 0.5 at% to 5.0 at%) were collected using the Syntex P21 four-circle diffractometer and subsequently analysed using the SHELX-76 computer programmes to obtain the relative shifts in positions of Sn and dopant, Me, in a unit cell. It has been found that substitution occurs on doping whereby the Me ion replaces the Sn ion. In addition, the Sn and Me ions are displaced from the original undoped Sn ion positions.
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