Journal of the Physical Society of Japan
Online ISSN : 1347-4073
Print ISSN : 0031-9015
ISSN-L : 0031-9015
Temperature Dependence of Diffusion Coefficients and Annealing Kinetics of Voids in Quenched β-Brass
Iwao HashimotoMasanori TsukudaKenichi YamamotoHiroyuki Yamaguchi
著者情報
ジャーナル 認証あり

1992 年 61 巻 11 号 p. 4098-4105

詳細
抄録
Thin foil specimens of β-brass containing Cu-46.35 at.%Zn quenched from 973 K are annealed at various temperatures between 403 K and 473 K for various times. Anti-phase domain boundaries (APBs) and voids are observed by transmission electron microscopy. Almost all voids are in APBs and a few ones are in the anti-phase domains (APDs). The diffusion coefficient of copper or zinc atoms in β-brass estimated from the shrinkage rate of the voids in APDs DD and that estimated from their shrinkage rate in APBs DA are given by DD=5 exp (−1.58 eV⁄kT) and DA=0.56 exp (−1.29 eV⁄kT) (cm2/s), respectively. The annealing kinetics of voids have been discussed briefly from the view point on the ordering energy of β-brass.
著者関連情報

この記事は最新の被引用情報を取得できません。

© THE PHYSICAL SOCIETY OF JAPAN
前の記事 次の記事
feedback
Top