1993 年 62 巻 2 号 p. 424-426
We measured low-temperature conductance of epitaxially grown NiAl crystalline wires. In highly conductive samples, we observed time dependent conductance fluctuation, which was attributed to the motion of scattering centers. In low-conductance samples, the temperature dependence of the conductance was well described by the 1⁄\sqrtT relationship predicted by the theory of weak localization.
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