Improved Artificial Bee Colony Algorithm and its Application in Classification

Abstract

For improving the classification accuracy of the classifier, a novel classification methodology based on artificial bee colony algorithm is proposed for optimal feature and SVM parameters selection. In order to balance the ability of exploration and exploitation of traditional ABC algorithm, improvements are introduced for the generation of initial solution set and onlooker bee stage. The proposed algorithm is applied to four datasets with different attribute characteristics from UCI and efficiency of the algorithm is proved from the results.