Measurement of Secondary Electron Yield by Charge Amplification Method

Abstract

As the initial step to realize a reliable measurement of the secondary electron yield of insulating materials using charge amplification method proposed by K. Goto, a pair of the charge amplifiers to measure a small amount of the electron charge of less than ∼1 pC have been developed. These amplifiers showed linear input⁄output characteristics within the range of the input charge of ∼0.1 to ∼6 pC. The secondary electron yield δ(Ep) of soot was measured by employing these charge amplifiers, and compared with that measured by the conventional current-mode method. The result showed that the charge amplification method enables the secondary electron yield to be measured using the primary electron charge of only ∼1 pC.