Journal of Surface Analysis
Online ISSN : 1347-8400
Print ISSN : 1341-1756
ISSN-L : 1341-1756
Extended Abstracts from 8th International Symposium on Practical Surface Analysis (PSA19)
Scattering-angle Selective STEM Images for a Co-Cr-Mo Alloy Fabricated by Selective Laser Melting
Masayasu Nagoshi Susumu TsuikimotoKenji OgataTakaya NakamuraYoshimitsu Okazaki
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2019 Volume 26 Issue 2 Pages 212-213

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Abstract
Cellular structure of a Co-Cr-Mo alloy fabricated by selective laser melting (SLM) has been investigated by scanning transmission electron microscopy (STEM). Angle-selective STEM detector provides diverse information on the microstructures of the alloy. Annular dark field (ADF)-STEM images with medium scattering angle visualize defect distributions at the interfaces and stacking faults crossing the interfaces. Thickness distributions of thin film specimen made by an electro polishing affect the contrasts in the STEM images and then require careful considerations for correct interpretations of the images.
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© 2019 by The Surface Analysis Society of Japan
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