Journal of Surface Analysis
Online ISSN : 1347-8400
Print ISSN : 1341-1756
ISSN-L : 1341-1756
Extended Abstract
Application of Secondary Ion Mass Spectrometry for Iron and Steel Material Analysis
Naoyoshi Kubota Yuto HiraginoRiki Sato
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2022 Volume 29 Issue 1 Pages 33-38

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Abstract
Time-of-flight secondary ion mass spectrometry with a focused ion beam system is a useful surface analysis to measure elemental mappings around 100 nm on a lateral resolution and trace element detections on a range of ppm in atomic concentration. With these advantages, TOF-SIMS has been frequently used for iron and steel material analysis. We have demonstrated some applications in this paper, that is the B distribution along the grain boundaries in the steel sample with a trace amount of B, the detection of tribofilm from the test piece surface after the sliding test, and so on.
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© 2022 by The Surface Analysis Society of Japan
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