Abstract
In order to evaluate the nanometer-scale work function (Apparent Local Barrier Height: LBH) relating to physical and chemical characteristics of the surface by means of the scanning tunneling microscope, we have examined the relation between measurement condition (in this case, the tip-sample bias voltage) and obtained LBH. It is found that there is correlation of the bias voltage effect on LBH with the current-voltage (I-V) characteristic. Therefore, if the LBH is scanned, the I-V curve have to be measured at the same tip-sample separation used in the scan, in order to classify the bias voltage used in the scan.
