JSAI Technical Report, Type 2 SIG
Online ISSN : 2436-5556
Fault Cause Estimation Using Simplified Digital Twin Based on 1D-CAE
Shinji ORIHARAKota HIROSHIMAYohei NAWAKIKentaro NOMOTOKazuyuki TSURUOKA
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RESEARCH REPORT / TECHNICAL REPORT FREE ACCESS

2025 Volume 2025 Issue SMSHM-003 Pages 01-

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Abstract

Digital Twin is a technology that creates simulation models of machines or processes. When combined with sensing data, it enables real-time monitoring and analysis of the target system. However, challenges remain in creating high-precision models and in the associated costs. In this study, we propose a simplified Digital Twin based on 1D-CAE models generated through Model Based Development (MBD), for anomaly cause estimation. This approach does not produce a complete model of the target but rather a partial one. The model contains errors due to unmodeled factors and noise. Nevertheless, this method can estimate the causes of faults.

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