Damaged Fruits Inspecting System by Machine Vision (Part 2) Defects Evaluating Algorithm by Gray-level Differece in Near-infrared Image

Xiaoming LI; Toshio IWAO; Tateshi FUJIURA; Sakae SHIBUSAWA; Kouichi TAKEYAMA; Kentaro MOHRI

doi:10.11357/jsam1937.56.37

Damaged Fruits Inspecting System by Machine Vision (Part 2)

Defects Evaluating Algorithm by Gray-level Differece in Near-infrared Image

Xiaoming LI, Toshio IWAO, Tateshi FUJIURA, Sakae SHIBUSAWA, Kouichi TAKEYAMA, Kentaro MOHRI

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Keywords: machine vision, near-infrared image, gray-level, superslice algorithm, discriminant analysis, fruit, peach

JOURNAL FREE ACCESS

1994 Volume 56 Issue 1 Pages 37-44

DOI https://doi.org/10.11357/jsam1937.56.37

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Abstract

This paper describes the detecting algorithm of defective peach to develop an inspection system by machine vision. The detecting algorithm of defective peach was developed based on the differences of the gray-level between normal and defective, ultilizing superslices algorithm and the method of discriminant analysis. Two methods had been investigated in detecting the defects such as worm hole, scar, rot, squash and peeled. Anyone can exactly split the defects from the peach images.

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