JSAP Annual Meetings Extended Abstracts
Online ISSN : 2436-7613
[volume title in Japanese]
Session ID : 18p-E1-5
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Work Function Measurement of C/W Stacked Structure on SiO2 Gage Dielectrics
*[in Japanese][in Japanese][in Japanese]Parhat Ahmet[in Japanese][in Japanese][in Japanese][in Japanese][in Japanese][in Japanese][in Japanese]
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© 2012 The Japan Society of Applied Physics
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