[volume title in Japanese]
Session ID : 17a-E3-9
Conference information
Host: The Japan Society of Applied Physics
Name : [in Japanese]
Number : 59
Location : [in Japanese]
Date : March 15, 2012 - March 18, 2012
Investigation of AlN/AlGaN/GaN MIS-HFET by temperature-dependent measurements of frequency dispersion in C-V characteristics
Details
Article 1st page
