JSAP Annual Meetings Extended Abstracts
Online ISSN : 2436-7613
The 61st JSAP Spring Meeting 2014
Session ID : 18p-PA11-4
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Local Electrical Properties of Mn-Nanodots embedded SiOx MIM Diodes by Atomic Force Microscopy Using a Conducting Probe
*Takashi AraiChong LiuAkio OhtaKatsunori Makiharaseiichi Miyazaki
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Keywords: 18p-PA11-4
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© 2014 The Japan Society of Applied Physics
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