JSAP Annual Meetings Extended Abstracts
Online ISSN : 2436-7613
The 61st JSAP Spring Meeting 2014
Session ID : 19p-D9-9
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Host: The Japan Society of Applied Physics

Name : JSAP Spring Meeting

Number : 61

Location : [in Japanese]

Date : March 17, 2014 - March 20, 2014

Spatial Variation in Carrier Concentration in Nanocrystal Ni-Si Films Measured by Multimode Scanning Probe Microscopy
*Leonid Bolotov, Noriyuki Uchida, Tetsuya Tada, Toshihiko Kanayama
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Keywords: 19p-D9-9
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© 2014 The Japan Society of Applied Physics
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