JSAP Annual Meetings Extended Abstracts
Online ISSN : 2436-7613
The 61st JSAP Spring Meeting 2014
Session ID : 19p-D9-18
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Effects of Nitrogen Concentration on the Electrical Properties of HfN Gate Insulator Formed by ECR Plasma Sputtering
*Elham HeidariSohya KoudohNithi AtthiDae-Hee HanShun-ichiro Ohmi
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© 2014 The Japan Society of Applied Physics
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