JSAP Annual Meetings Extended Abstracts
Online ISSN : 2436-7613
The 61st JSAP Spring Meeting 2014
Session ID : 18p-PG6-10
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In-situ reflectivity measurement under growth of GaAs/InGaAs buffer on silicon
*Masakazu AraiRyo NakazoRyuzo IgaMasaki Kohtoku
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Keywords: 18p-PG6-10
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© 2014 The Japan Society of Applied Physics
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