JSAP Annual Meetings Extended Abstracts
Online ISSN : 2436-7613
The 75th JSAP Autumn Meeting 2014
Session ID : 19a-A17-1
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Evidence for Si up-diffusion during scavenging of interfacial SiO2 in HfO2/SiO2/Si stack
*Xiuyan LiTakeaki YajimaTomonori NishimuraKousuke NagashioAkira Toriumi
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© 2014 The Japan Society of Applied Physics
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