JSAP Annual Meetings Extended Abstracts
Online ISSN : 2436-7613
The 75th JSAP Autumn Meeting 2014
Session ID : 17p-C5-4
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Synchrotron X-ray crystallinity evaluation of GaN single-crystal wafers grown by Na flux method
*Shuhei FukudaYoshiyuki TsusakaHidekazu TakanoYasushi KagoshimaSoichi NoseShingo TakedaKazushi YokoyamaJunji MatsuiMasayuki ImanishiYuma TodorokiMihoko MaruyamaMamoru ImadeMasashi YoshimuraYusuke Mori
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Keywords: 17p-C5-4
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© 2014 The Japan Society of Applied Physics
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