The 62nd JSAP Spring Meeting 2015
Session ID : 14a-D14-8
Conference information
Host: The Japan Society of Applied Physics
Name : JSAP Spring Meeting
Number : 62
Location : [in Japanese]
Date : March 11, 2015 - March 14, 2015
A new method to determine deep trapping lifetime in organic semiconductor devices using impedance spectroscopy
Details
Article 1st page
