JSAP Annual Meetings Extended Abstracts
Online ISSN : 2436-7613
The 76th JSAP Autumn Meeting 2015
Session ID : 15p-1C-1
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Substrate Bias Dependence of RTN Amplitude Statistics in FD-SOTB nMOSFET
*Kyungmin JangTomoko MizutaniKiyoshi TakeuchiTakuya SarayaMasaharu KobayashiToshiro Hiramoto
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© 2015 The Japan Society of Applied Physics
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