JSAP Annual Meetings Extended Abstracts
Online ISSN : 2436-7613
The 76th JSAP Autumn Meeting 2015
Session ID : 14a-2B-9
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Noise analyses of GaN:Eu red LED: A new application to measure charge capturing properties of emission centers
*Masashi IshiiAtsushi KoizumiYasufumi Fujiwara
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Keywords: 14a-2B-9, GaN, Eu, Noise
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© 2015 The Japan Society of Applied Physics
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