The 76th JSAP Autumn Meeting 2015
Session ID : 15p-2J-7
Conference information
Host: The Japan Society of Applied Physics
Name : JSAP Autumn Meeting
Number : 76
Location : [in Japanese]
Date : September 13, 2015 - September 16, 2015
Visualization of Conductive Filament during Write and Erase Cycles on Nano-scale ReRAM Observed by in-situ TEM
*Yasuo Takahashi, Kudo Masaki, Arita Masashi, Ohba Kazuhiro, Shimuta Masayuki, Fujiwara Ichiro
Author information
Keywords:
15p-2J-7,
semiconductor,
in-situ transmission electron microscopy,
resistive random access memory
Details
Article 1st page
