The 63rd JSAP Spring Meeting 2016
Session ID : 19p-S011-10
Conference information
Host: The Japan Society of Applied Physics
Name : JSAP Spring Meeting
Number : 63
Location : [in Japanese]
Date : March 19, 2016 - March 22, 2016
Carrier dynamics in an InGaN single QW studied by the SNOM transient lens method
Keywords:
19p-S011-10,
transient lens method,
Scanning Near-field Optical Microscope,
carrier dynamics
Details
Article 1st page
