The 63rd JSAP Spring Meeting 2016
Session ID : 22a-H113-4
Conference information
Host: The Japan Society of Applied Physics
Name : JSAP Spring Meeting
Number : 63
Location : [in Japanese]
Date : March 19, 2016 - March 22, 2016
Experimental comparison of non-contact scanning nonlinear dielectric potentiometry and Kelvin probe force microscopy
Keywords:
22a-H113-4,
Kelvin probe force microscopy,
scanning nonlinear dielectric microscopy,
contact potential difference
Details
Article 1st page
