The 63rd JSAP Spring Meeting 2016
Session ID : 19p-H137-7
Conference information
Host: The Japan Society of Applied Physics
Name : JSAP Spring Meeting
Number : 63
Location : [in Japanese]
Date : March 19, 2016 - March 22, 2016
X-ray phase scanner using Talbot-Lau interferometry for non-destructive testing – II
*Shivaji Bachche, Masahiro Nonoguchi, Koichi Kato, Masashi Kageyama, Takafumi Koike, Masaru Kuribayashi, Atsushi Momose
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