JSAP Annual Meetings Extended Abstracts
Online ISSN : 2436-7613
The 63rd JSAP Spring Meeting 2016
Session ID : 19p-W834-12
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Characterization of Dopant in Individual Si / Ge Core-Shell Nanowires Investigated by Atom Probe Tomography
*Bin HanYasuo ShimizuWipakorn JevasuwanKotaro NishibeKoji InoueNaoki FukataYasuyoshi Nagai
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© 2016 The Japan Society of Applied Physics
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