The 63rd JSAP Spring Meeting 2016
Session ID : 21a-S323-5
Conference information
Host: The Japan Society of Applied Physics
Name : JSAP Spring Meeting
Number : 63
Location : [in Japanese]
Date : March 19, 2016 - March 22, 2016
Detection and characterization of surface electron traps in a GaAs-based nanowire by a metal probe-induced local surface potential modulation
Details
Article 1st page
