The 63rd JSAP Spring Meeting 2016
Session ID : 19a-P4-26
Conference information
Host: The Japan Society of Applied Physics
Name : JSAP Spring Meeting
Number : 63
Location : [in Japanese]
Date : March 19, 2016 - March 22, 2016
Gate-bias and temperature dependent characteristics in organic thin-film transistors with MoO3/Au electrode structure
Details
Article 1st page
