The 63rd JSAP Spring Meeting 2016
Session ID : 21a-S422-10
Conference information
Host: The Japan Society of Applied Physics
Name : JSAP Spring Meeting
Number : 63
Location : [in Japanese]
Date : March 19, 2016 - March 22, 2016
Channel Electron Effective Mass Dependence of Source-Drain Direct Tunneling Current in III-V n-MOSFETs with Sub-10 nm Gate Lengths
Keywords:
21a-S422-10,
source-drain direct tunneling currentr,
III-V nMOSFET,
Wigner Monte Carlo method
Details
Article 1st page
