JSAP Annual Meetings Extended Abstracts
Online ISSN : 2436-7613
The 63rd JSAP Spring Meeting 2016
Session ID : 22a-W541-6
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Effects of high-temperature anneal on operation characteristics of GaN MOSFET
*Kenya NishiguchiTamotsu Hashizume
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Keywords: 22a-W541-6, GaN, MOS, anneal
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© 2016 The Japan Society of Applied Physics
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