JSAP Annual Meetings Extended Abstracts
Online ISSN : 2436-7613
The 63rd JSAP Spring Meeting 2016
Session ID : 22a-S421-10
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Layer Number Identification of Sputtering Deposited MoS2 Thin Films by X-ray Photoelectron Spectroscopy and Optical Contrast Method
*SEIYA ISHIHARAYUSUKE HIBINONAOMI SAWAMOTOKOHEI SUDATAKUMI OHASHIKENTAROU MATSUURAHIDEAKI MACHIDAMASATO ISHIKAWAHIROSHI SUDOHHITOSHI WAKABAYASHIATSUSHI OGURA
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Keywords: 22a-S421-10, MoS2
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© 2016 The Japan Society of Applied Physics
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