The 63rd JSAP Spring Meeting 2016
Session ID : 19a-W810-1
Conference information
Host: The Japan Society of Applied Physics
Name : JSAP Spring Meeting
Number : 63
Location : [in Japanese]
Date : March 19, 2016 - March 22, 2016
Thicker and Larger Effective Area of Gated Silicon Drift Detector Using a Low-Resistivity Wafer
*Akinobu Takeshita, Shungo Sakurai, Yuya Oda, Shinya Fukushima, Shohei Ishikawa, Atsuki Hidaka, Hideharu Matsuura
Author information
Keywords:
19a-W810-1,
low-cost X-ray detector
Details
Article 1st page
