The 63rd JSAP Spring Meeting 2016
Session ID : 21a-P6-1
Conference information
Host: The Japan Society of Applied Physics
Name : JSAP Spring Meeting
Number : 63
Location : [in Japanese]
Date : March 19, 2016 - March 22, 2016
Layer Characteristic Measurement of Dielectric Substrate Using THz-TDS Reflection Measurement
*Yuya Tojima, Keizo Cho, Takayuki Kubota, Koji Suizu, Hiroki Sudo, Hiroaki Nakabayashi
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Article 1st page
