The 64th JSAP Spring Meeting 2017
Session ID : 14p-P8-10
Conference information
Host: The Japan Society of Applied Physics
Name : JSAP Spring Meeting
Number : 64
Location : [in Japanese]
Date : March 14, 2017 - March 17, 2017
Thermal Management Method for Chip-Scale Package Light-Emitting Diodes During Reliability Tests
Details
Article 1st page
