JSAP Annual Meetings Extended Abstracts
Online ISSN : 2436-7613
The 64th JSAP Spring Meeting 2017
Session ID : 14p-311-8
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Depth distribution of the chemical composition and electronic structures of the CH3NH3PbI3 thin film probed by excitation energy dependence of the XPS
*Soichiro YamanakaKei HayakawaTomoya SatoRyohei TsurutaHisao IshiiKazuhiko MaseCojocaru LudmilaSatoshi UchidaYasuo Nakayama
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© 2017 The Japan Society of Applied Physics
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