The 64th JSAP Spring Meeting 2017
Session ID : 16a-302-11
Conference information
Host: The Japan Society of Applied Physics
Name : JSAP Spring Meeting
Number : 64
Location : [in Japanese]
Date : March 14, 2017 - March 17, 2017
Bias-stress characterization of bottom gate, bottom contact Ph-BTBT-10 Field Effect Transistor
Details
Article 1st page
