The 64th JSAP Spring Meeting 2017
Session ID : 14p-F204-1
Conference information
Host: The Japan Society of Applied Physics
Name : JSAP Spring Meeting
Number : 64
Location : [in Japanese]
Date : March 14, 2017 - March 17, 2017
Fabrication and Evaluation of Implantable CMOS Imaging Device for Feeble Fluorescence Measurement
*Akari Shiraishi, Yoshinori Sunaga, Hiroshi Yamaura, Koki Fujimoto, Makito Haruta, Toshihiko Noda, Kiyotaka Sasagawa, Takashi Tokuda, Yumiko Yoshimura, Jun Ohta
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